GRASP: A General Routine for Attribute Sampling Plan Evaluation

Abstract

A FORTRAN computer program is presented that will evaluate an arbitrary single, double, or multiple sampling plan using hypergeometric, binomial, Poisson, or normal probabilities. An option is also included that will permit the calculation of the fraction defective values associated with arbitrary specified values of probability of acceptance.

• Attribute Sampling Plans
• Operating Characteristics

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Additional information

Notes on contributors

Edward G. Schilling

Dr. Schilling is Manager of the Statistics and Quality Systems Operation at the General Electric Company, F. J. Borch Lighting Research Center at Nela Park, Cleveland, Ohio. He is a fellow of ASQC.

John H. Sheesley

Mr. Sheesley is a senior statistician at the General Electric Company, F. J. Borch Lighting Research Center. He is a senior member of ASQC.

Peter R. Nelson

Dr. Nelson is an assistant professor of statistics at Ohio State University and is a member of ASQC.