![Sample our Engineering & Technology journals, sign in here to start your access, latest two full volumes FREE to you for 14 days]({"type":"image" , "src" : "/sda/5933/TOC-Subject-Sample-2021-Engineering-Tech.jpg"})
Abstract
Various examples illustrate how to obtain confidence limits on the mean time between failures (MTBF) of an exponential distribution from data obtained from one of the fixed-size or sequential test plans of MIL-STD-781C. For fixed-length tests, the methods by B. Epstein and the modifications of H. L. Harter are briefly discussed. For the sequential tests simple charts for newly developed methods of Bryant and Schmee are given.
Additional information
Notes on contributors
Josef Schmee
Dr. Schmee is an associate professor in the Institute of Administration and Management. He is a member of ASQC.
