Abstract
An economic acceptance sampling plan by attributes is developed for situations where sampling inspection is expensive and/or destructive. It is assumed that the sampling inspection is error free, but that screening inspection of rejected lots is subject to error. Three decision criteria are considered: acceptance, screening, or scrapping. A linear cost model is given and methods for finding optimal sampling plans are presented for both a beta binomial prior and a double binomial prior. Comparisons are made with plans using only two decisions.
Additional information
Notes on contributors
Moon Charn Riew
Mr. Riew is a Graduate Student in the Department of Industrial Engineering.
Do Sun Bai
Dr. Bai is a Professor in the Department of Industrial Engineering. He is a Member of ASQC.