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Abstract
Lower confidence limits are derived for the common measures of process capability, usually indicated by Cp, CPU, CPL, and Cpk. The measures are estimated based on a random sample of observations from the process when the process is assumed to be normally distributed and has reached a state of statistical control.
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Notes on contributors
Youn-Min Chou
Dr. Chou is an Associate Professor in the Mathematics, Computer Science, and Statistics Department. She is a Member of ASQC.
D. B. Owen
Dr. Owen is a University Distinguished Professor in the Statistical Science Department. He is a Fellow of ASQC and an ASQC Certified Reliability Engineer.
A. Borrego
Dr. Borrego is Director of SABA Consultores. He is a Member of ASQC.