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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 34, 2002 - Issue 4
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Articles

SPC Monitoring of MMSE- and Pi-Controlled Processes

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Pages 384-398 | Published online: 20 Feb 2018
 

Abstract

To reduce variation in manufacturing processes, traditional statistical process control (SPC) techniques can be applied to monitor automatic process control (APC) controlled processes for detecting assignable cause process variation. In this paper we compare the monitoring of process output and the monitoring of the control action of Minimum-Mean-Squared-Error- and Proportional-Integral-Controlled processes. We show that the robustness property of the PI controller makes it difficult to detect unanticipated mean shifts when the process output is being monitored. We illustrate how the signal-to-noise ratios developed in Jiang, Tsui, and Woodall (2000) can be used to predict the SPC chart performance and help select the appropriate chart for monitoring.

Additional information

Notes on contributors

Wei Jiang

Dr. Jiang is a Statistical Consultant in INSIGHT Division. He is a member of ASQ. His e-mail address is [email protected].

Kwok-Leung Tsui

Dr. Tsui is a Professor in the School of Industrial and System Engineering. He is a senior member of ASQ. His e-mail address is [email protected].

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