Abstract
Phase I analysis of nonlinear profiles aims at identifying the data from an in-control process as accurately as possible so that quality engineers can have a good reference to establish the control charts for a future process. Unlike linear profiles, which can be represented by a linear regression model with its model parameters used for monitoring and detection, nonlinear profiles are often sampled into high-dimensional data vectors and analyzed by nonparametric methods. Meanwhile, automatic in-process data-collection devices generate huge historical data sets, which must be analyzed for the presence of observations from out-of-control process conditions. The high dimensionality and data contamination present a challenge to the Phase I analysis of nonlinear profiles. This paper presents a strategy that consists of two major components: a data-reduction component that projects the original data into a lower dimension subspace while preserving the data-clustering structure and a data-separation technique that can detect single and multiple shifts as well as outliers in the data. Simulated data sets as well as nonlinear profile signals from a forging process are used to illustrate the effectiveness of the proposed strategy.
Additional information
Notes on contributors
Yu Ding
Dr. Ding is an Assistant Professor in the Department of Industrial and Systems Engineering, Texas A&M University. His email address is [email protected].
Li Zeng
Ms. Zeng is a Graduate Student in the Department of Industrial and Systems Engineering, The University of Wisconsin at Madison. Her email address is [email protected].
Shiyu Zhou
Dr. Zhou is an Assistant Professor in the Department of Industrial and Systems Engineering, The University of Wisconsin at Madison. His email address is [email protected].