The dielectric dispersion surface for the nitrogen molecule in the gas phase

Abstract

The generalized oscillator strength (GOS) distribution for the nitrogen molecule, obtained by high energy electron-impact spectroscopy, is employed for the first time to investigate the real and imaginary parts of the dielectric constant as a function of energy loss E and momentum transfer K. Refractive index values obtained from this work in the vacuum ultraviolet range and at the optical limit, K → 0, are compared with available theoretical and experimental values.