Publication Cover
Spectroscopy Letters
An International Journal for Rapid Communication
Volume 31, 1998 - Issue 6
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Original Articles

A Rapid Method for the Determination of Trace Element Impurities in Silicons Oils by ICP-MS After Microwave-Assisted Digestion

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Pages 1245-1253 | Received 30 Mar 1998, Published online: 20 Aug 2006
 

Abstract

A microwave-assisted digestion procedure has been developed for the treatment of silicone oil samples. Inductively coupled plasma mass spectrometry (ICP-MS) was used to determine the concentration level of 40 trace element impurities, like Li, Na, Mg, Al, P, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, As, Se, Sr, Rb, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Ba, La, Ce, Nd, Hf, W, Au, Pb, Hg, Th, Bi and U in these samples, having obtained average relative standard deviation values of 9.6%. The methodology developed has been tested by recovery studies on different natural samples spiked with known amounts of Mg, Cr, Mn, Fe, Zn and Pb at concentration levels of 10, 0.5, 5, 5, 10 and 1 μg g−1 and recovery percentage values varies from 97 to 105 %.

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