Flexible reliability assessment of digital circuits based on signal probability

ABSTRACT

In order to evaluate the reliability of VLSI, a level matrix for reliability and signal propagation evaluation is proposed based on the combination of probabilistic transfer matrix and signal probability reliability. By appropriate operations of the proposed matrix, reliability and signal probability of the entire circuit as well as the individual output(s) can be obtained flexibly. This new approach realizes hierarchical calculation by the proposed level matrix propagated from the previous state instead of the primary one. The efficiency and feasibility of the proposed method have been verified by both combinational and sequential benchmark circuits.

KEYWORDS:

• Reliability assessment
• level matrix
• signal probability
• flexibility

Disclosure statement

No potential conflict of interest was reported by the authors.

ORCID

Xingjian Xu http://orcid.org/0000-0003-1778-2304

Tian Ban http://orcid.org/0000-0002-2639-201X

Additional information

Funding

This work was supported by the National Natural Science Foundation of China [61401205].