ABSTRACT
Optical transforms of two-dimensional model functions for smectic A structures have been produced using a laser- optical Fraunhofer diffraction set-up. The schematic models enable, in particular, the control of two influential parameters:
| (i) | the structure factor of the smectic layers and | ||||
| (ii) | the effect of transverse undulations of the smectic layers. | ||||
The comparison of optical transforms with high-resolution X-ray diffraction patterns of magnetically oriented smectic A liquid crystals reveals that both the structure factor and transverse undulations affect the profile and intensity of the peaks in the X-ray diffraction pattern. The optical transform of the best schematic model only shows one meridional reflection and a lateral broadening. Both characteristics of this very sharp reflection are observed in the X-ray pattern for a well aligned smectic A structure.