60
Views
2
CrossRef citations to date
0
Altmetric
Original Articles

Transmission electron microscopy investigation of boron-doped polycrystalline chemically vapour-deposited diamond

, , &
Pages 1741-1768 | Received 07 Aug 2001, Accepted 27 Jan 2002, Published online: 04 Aug 2009
 

Abstract

Thick samples of boron-doped chemically vapour-deposited diamond have been studied in plan view, by taper section and in cross-section by transmission electron microscopy. Dislocations, nanotwins and grain boundaries have been investigated by diffraction contrast techniques and reasons have been found for their introduction during the growth process. The observations have been correlated with others at lower magnification by scanning electron microscopy and as a result the nature and importance of grain clusters have become apparent. In addition it has been found that (110) growth favours the introduction of geometrically determined stresses and related defects while in (112) growth these effects are greatly reduced. However, (110) growth produces equiaxed grain clusters but (112) growth generates elongated grain clusters.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.