Abstract
The diffraction-contrast preservation through various inelastic scattering processes has been studied with a 1·5 MV conventional transmission electron microscope fitted with an electron energy filter, for the case of thickness fringes and bend contours. Inelastic images due to plasmon, core electron excitation or multiple scattering in the energy-loss range up to 1700 eV are compared with elastic or unfiltered images. Attention has been drawn to the K-loss signal. Images show that inelastic mechanisms preserve contrast effects. In the inner-shell mechanisms, localization effects are not significant for the energy transfers and scattering angles typical in electron microscopy.