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The characteristic splitting values for screw and 60° dislocations in foils used in the weak-beam and lattice-resolution methods have been investigated theoretically. Theory and experiment are compared for dislocations in GaAs. Splitting of screw dislocations in foils 10 to 50 mm thick is shown to reduce considerably with decreasing foil thickness. Splitting of the 60° dislocations is found to be practically independent of foil thickness.
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