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Original Articles

High-resolution microdiffraction study of notch-tip deformation in Mo single crystals using X-ray synchrotron radiation

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Pages 571-583 | Received 29 Apr 1988, Accepted 25 Jan 1989, Published online: 13 Sep 2006
 

Abstract

A new technique is presented for the determination of strain fields in single crystals, based on the simultaneous recording of the energy and position of a diffracted beam, with a resolution of 25μm under current experimental conditions. The technique can be profitably used for perfect to highly deformed crystals, in materials as highly absorbing as Mo, and allows a spatial resolution of one part in 104. Indications are given as to possible refinements and improvements of the method.

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