Abstract
A new technique is presented for the determination of strain fields in single crystals, based on the simultaneous recording of the energy and position of a diffracted beam, with a resolution of 25μm under current experimental conditions. The technique can be profitably used for perfect to highly deformed crystals, in materials as highly absorbing as Mo, and allows a spatial resolution of one part in 104. Indications are given as to possible refinements and improvements of the method.