Dynamical simulations of diffraction contrast images of straight dislocations in icosahedral quasicrystals

Z. G. Wang Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, PO Box 2724, 100080, Beijing, PR China; Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, PO Box 918, 100039, Beijing, PR China

R. Wang Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, PO Box 2724, 100080, Beijing, PR China; Department of Physics, Wuhan University, 430072, Wuhan, PR China

J. L. Feng Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, PO Box 2724, 100080, Beijing, PR China; Department of Physics, Wuhan University, 430072, Wuhan, PR China

Abstract

The diffraction contrast images of straight dislocations in icosahedral quasicrystals have been simulated by using a computer program based on the dynamical diffraction theory extended to quasicrystals. By varying the crystallographic parameters and imaging conditions, the diffraction contrast images of screw, edge and mixed types of dislocation are simulated systematically. Finally, a comparison of simulations with the experimentally obtained images is made.

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Dynamical simulations of diffraction contrast images of straight dislocations in icosahedral quasicrystals

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Dynamical simulations of diffraction contrast images of straight dislocations in icosahedral quasicrystals

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