Abstract
Scanning transmission electron diffraction with energy filtering has been used to study thin films of supercooled liquid lead (thickness 5–60 Å) grown on graphite substrates under UHV conditions. The liquid structure factor was determined (after applying appropriate corrections) by using the high-angle-fitting and the Krogh-Moe methods. The reliability of the normalization was assessed by the Rahman criterion : this gave an accuracy of 1% for the structure factor for Q = 0·5 to 11·0 Å−1.