Langevin recombination of drifting electrons and holes in stabilized a-Se (Cl-doped a-Se: 0.3% As)

Abstract

The double flash technique of F. K. Dolezalek and W. E. Spear (1975, J. Phys. Chem. Solids, 36, 819) for the measurement of recombination coefficients was used to determine the recombination mechanism of drifting electrons and holes in stabilized a-Se (Cl-doped a-Se: 0.3% As). The experiments show that the recombination process follows the Langevin mechanism.