Abstract
Electron paramagnetic resonance (EPR) has been used to investigate defects in hexagonal boron nitride (BN), polycrystalline cubic BN, BN and BN: C films produced by reactive sputtering. The dominant paramagnetic centre is attributed to the N vacancy. The Epr relaxation parameters have been deduced from the saturation data. In the investigated temperature range the spin-lattice relaxation rate was found to follow an almost linear temperature dependence possibly related to local modes.