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Abstract
Diffuse reflectance Fourier transform spectroscopy (DRIFTS) is used to gain abundant structural information about thin layer chromatographically (TLC) separated materials. Quantitative and qualitative in situ DRIFTS analysis can be accomplished considering the effect of the TLC chromatographic support on the optical measurement of the TLC spot. Methods for in situ FTIR analysis of TLC spots are reviewed along with techniques proposed to overcome spectral interferences associated with the in situ measurement.