Abstract
Time domain spectroscopy in reflection mode has been used to determine line parameters like Impedance (Z), peak percent reflection (ρmax), distance from the reference plane to the narrow trace discontinuity (I) etc in the frequency range of 10 MHz to 10 GHz. Differential mode impedance (Zdit) and Common mode impedance (Zcom) of two uncoupled lines are also measured using fast differential Time Domain Reflectometry (TDR) technique.
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Notes on contributors
V P Pawar
V P Pawar was born in 1966. He received MSc (Physics) degree with specialisation in Applied Electronics in 1988 from Marathwada University, Maharashtra (India). In the same year he joined as a Lecturer in Electronics in Maharashtra Udayagiri College, Udgir. He obtained his MPhil (Electronics) degree in 1998 from Shivaji University, Kolhapur (India). Under UGC IXth plan period now has joined as a Research Teacher Fellow to complete his PhD on topic "Study of Semiconductor junctions using Differential TDR Technique" in Dr B A M University under the guidance of Dr S C Mehrotra. He has presented papers in national and international conferences.
N M More
N M More was born in 1966. He received MSc Physics degree with specialisation in Electronics in 1989 from Marathwada University, Maharashtra (India). He joined as a Lecturer in Physics in Shri Chhatrapati Shivaji College, Omerga, on 1st Jan 1990. Under UGC IXth plan period now has joined as a Teacher Research Fellow to complete his PhD at Dr B A M University under the guidance of Prof S C Mehrotra.
S C Mehrotra
S C Mehrotra was born in 1951. He received MSc (physics) from Allahabad University in 1970 and PhD from University of Texas at Austin in 1975. He is recipient of UGC career award and Alexander Von Humborlt fellowship. He is presently Professor in Computer science at Dr B A M University, Aurangabad. He is fellow of National Academy of Sciences.