449
Views
3
CrossRef citations to date
0
Altmetric
Articles

Inference on stress–strength reliability for exponential distributions with a common scale parameter

ORCID Icon, &
Pages 3008-3031 | Received 07 Jul 2018, Accepted 27 May 2019, Published online: 03 Jun 2019
 

ABSTRACT

This paper considers estimation of the stress–strength reliability when the stress and strength follow two-parameter exponential distributions having different location parameters and a common scale parameter. All parameters are assumed to be unknown. We derive the uniformly minimum variance unbiased estimator, Bayes estimators and an affine equivariant estimator of the stress–strength reliability. We propose confidence intervals of the stress–strength reliability based on the generalized variable approach and percentile bootstrap method. We also derive an approximate confidence interval and Bayesian intervals of the reliability parameter. Numerical comparisons among the proposed estimators are carried out using intensive simulations. Illustrative examples have been given using real data sets.

Acknowledgments

The authors express sincere gratitude to the reviewers, Associate Editor and Editor for their valuable comments which led to the substantial improvement of the paper.

Disclosure statement

No potential conflict of interest was reported by the authors.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.