35
Views
38
CrossRef citations to date
0
Altmetric
Original Articles

A new type of layer structure defects in chiral smectics

&
Pages 87-93 | Received 08 May 1990, Accepted 05 Aug 1990, Published online: 24 Sep 2006
 

Abstract

Under a low frequency AC electric field applied to the SA phase an apparently homogeneous planar structure is obtained which is in fact composed of a system of parallel stripes perpendicular to the smectic layers. This texture persists even in the S*C phase. The stripes are explained as a contrast on elongated focal conics originating from undulations of smectic layers. Such undulations are formed as a consequence of a reduction in the smectic layer thickness due to the electroclinic effect. The deformation of smectic layers has been calculated on the basis of the elastic free energy associated with their deformation.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.