Local layer structure of the steep field line defect in surface-stabilized ferroelectric liquid crystal cells

Paula C. Willis Condensed Matter Laboratory, Department of Physics and Optoelectronic Computing Systems Center, University of Colorado at Boulder, Boulder, Colorado, 80309–0390, U.S.A.

Noel A. Clark Condensed Matter Laboratory, Department of Physics and Optoelectronic Computing Systems Center, University of Colorado at Boulder, Boulder, Colorado, 80309–0390, U.S.A.

Jiu-Zhi Xue Department of Physics, Princeton University, Princeton, New Jersey, 08590, U.S.A.

Cyrus R. Safinya Corporate Research Laboratories, Exxon Research and Engineering Co., Route 22 East, Annandale, New Jersey, 08801, U.S.A.

Abstract

The local layer structure of one type of DC electric field induced line defect observed in CS-1014 surface stabilized ferroelectric liquid crystal electro-optic cells has been determined using X-ray scattering and optical microscopy. The characterized defect is a high contrast defect line distinct from other field lines in that a defect mirror image is not produced when the DC field direction is reversed.

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Local layer structure of the steep field line defect in surface-stabilized ferroelectric liquid crystal cells

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Local layer structure of the steep field line defect in surface-stabilized ferroelectric liquid crystal cells

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