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Abstract
A TN structure is characterized by a twist angle (Theta) and a Deltand value, where Deltan is the refractive index anisotropy value of a liquid crystal material and d is the TN cell gap value. Two new methods for measuring these values have been proposed. One is to determine only the Deltand value by rotating the TN cell for a known Theta value. The other is to determine the Deltand value and the Theta value by rotating the analyser. After analysing these measurement methods, the Deltand value, or the Deltand value and Theta can be determined graphically. These methods can easily be applied to automatic measurement systems.