Leaf yield loss assessment due to Macrophomina root rot disease in mulberry gardens of south India

Abstract

Leaf yield loss in mulberry due to Macrophomina root rot disease was assessed in three different states of south India at field level. The highest leaf yield loss recorded was in V-1 variety (34.74%), whereas the lowest leaf yield loss was in K-2 variety (28.54%). However, the leaf yields losses in other varieties viz., MR-2 (32.90%), S-36 (32.06%), RFS-175 (31.75%) and S-13 (29.0%) recorded were medium. The average leaf yield loss was 31.49% due to root rot disease caused by M. phaseolina in mulberry.

Keywords:

• Root rot
• Macrophomina
• leaf yield
• mulberry
• disease

Acknowledgement

The authors are thankful to the Director, Central Sericultural Research and Training Institute, Srirampura, Mysore for providing facilitates and encouragement.