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Abstract
The process capability index, Cpk, is a useful tool for assessing the capability of a manufacturing process. There exist three well-known confidence intervals for the process capability index. These intervals are based on the standard bootstrap, the percentile bootstrap and the bias-corrected percentile bootstrap, respectively. We propose three variants of these bootstrap confidence intervals where each of the three intervals are modified in a particular way. Extensive Monte Carlo simulations are carried out and the results indicate that the three proposed bootstrap methods are generally preferred over the corresponding original schemes.
Acknowledgment
This work was supported by a 2-Year Research Grant of Pusan National University. The authors truly appreciate the valuable comments from anonymous referees which led to an improvement of our work.
Disclosure statement
No potential conflict of interest was reported by the authors.