Reliability analysis for degradation and shock process based on truncated normal distribution

Abstract

The reliability analysis for the system with degradation and random shocks is an important issue in the field of reliability engineering. In this paper, we use Wiener process to fit the performance degradation process, and regard both the degradation rate and the mean of the magnitude of shock load as random variables which follow the truncated normal distribution. With the Markov Chain Monte Carlo(MCMC), we provide a new method to estimate the parameters of the reliability function of the system. At the end of the paper, we take the degradation and shock data of the MOSFET as an example to show the effectiveness of the method presented in the paper.

Keywords:

• Degradation
• Reliability
• Shock
• Truncated normal distribution

Additional information

Funding

This work was supported by National Science Foundation of China (NSAF No.U1430125). The anonymous referees for our paper are appreciated with gratitude.