Abstract
Consider k (k ≥ 2) manufacturing processes whose mean θ
i
, variance and process capability index C
pw
(i), i = 1,…, k, are all unknown. For two given control values C
pw
(0) and
, we are interested in selecting some process whose capability index is no less than C
pw
(0) and is the largest in the qualified subset in which each process variance is no larger than
. Under a Bayes framework, we consider the normally distributed manufacturing processes taking normal-gamma as its conjugate prior. A Bayes approach is set up and an empirical Bayes procedure is proposed which has been shown to be asymptotically optimal. A simulation study is carried out for the performance of the proposed procedure and it is found practically useful.
Mathematics Subject Classification:
Acknowledgment
We are grateful to two referees for their patience of careful reading and many helpful comments which greatly lead to improvement of this presentation.