A synthetic control chart for monitoring the small shifts in a process mean based on an attribute inspection

Abstract

In this paper, a synthetic control chart is proposed by integrating the salient features of the np_x chart and the CRL chart. The synthetic chart achieves higher detection effectiveness on both small and large mean shifts while retaining the operational simplicity of the attribute charts owing to only using attribute inspection. Both statistical and economic design of the synthetic chart are considered and numerical tests have indicated that the synthetic chart has a higher power for detecting mean shifts than the np_x chart, MON chart and CUSUM chart. In addition, sensitivity analyses are also performed under both the statistical and economic design model.

Keywords:

• Quality control
• statistical process control
• attribute and variable control charts
• attribute inspection
• conforming run length

Additional information

Funding

This research is supported by the National Natural Science Foundation of China (NSFC: 71731006, 71571070, 71801096, 71790615 and 71431006), the Project supported by GDHVPS (2017).