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Abstract
The paper deals with the crucial problems of improving reliability in digital systems. The different parameters involved in reliability improvement are explained. The improvement pattern in reliability by the application of redundancy at the circuit level and systems level are discussed and computed assuming exponential law. It is explained that, in the state of the art of the conventional electronics, the method does not seem to be generally economically viable, but with the emergence of microminiaturization, integrated circuit packages and cryogenics, the situation is changing very fast.