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Abstract
The paper deals with the detection of faults in a two level negative gate network realizing general Boolean functions.
A mathematical approach has been formulated and an algorithm has been developed to generate test sets for faults of the “stuck-at-zero” and “stuck-at-one” type. Faults in all input lines, primary as well as functional, have been considered. The network is assumed to be presynthesized in its minimal form.
The algorithm is programmable on a digital computer.