Why and How of High Reliability Electronic Components for Space Application

Abstract

This paper discusses the necessity of carrying out qualification, screening and failure analysis of electronic components for space application. The result of failure analysis carried out in Quality Assurance Division of Vikram Sarabhai Space Centre is also discussed. In connection with failure analysis, illustrations are given with photographs taken with Scanning Electron Microscope (SEM) for some failure mechanism observed in the transistor and the integrated circuits.

Indexing Terms:

• Qualification
• Screening
• Failure Analysis
• Non-destructive
• Destructive Test