An Experimental Study of Shifting the Null Frequency of A Thin-Film Distributed Parameter R_o-C_o-KR_o Structure

Abstract

The frequency of the minimum output voltage of a null-filter configuration of the uniform thin-film R_o—C_o—KR_o structure is experimentally shifted within a narrow band of frequencies by connecting an external resistive or capacitive element in series with the common ground terminal. The results of this study are presented in this paper.

Indexing Terms:

• Thin-Film Network
• Distributed Parameter Network
• Null Filter
• R_o-C_o-KR^o Structure