Optimizing the Performance of Transistor-Resistor-Coupled Device Against Wide Variation of Temperature

Abstract

Temperature stability of the operating point of the transistor-resistor-coupled (TRC) device in common- emitter mode is studied analytically and the results are verified experimentally. It is shown that it is practically possible to select an operating point on the linear range of the transfer characteristic of the TRC device such that the device collector current is least temperature dependent. Such a study is significant in that it provides sufficient design data for the TRC device circuits.

Indexing Terms:

• Composite Unit
• Transistor-Resistor-Coupled Device
• Linear-Transfer Characteristic Device