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Original Articles

Some Features of Avalanche Breakdown Phenomena Part 1: Transistors and Diodes

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Pages 178-184 | Received 08 Mar 1978, Published online: 11 Jul 2015
 

Abstract

The temperature variations of the breakdown voltages of some commonly-used transistors and zener diodes, the negative-resistance characteristics of a transistor in the avalanche mode and their dependence on the base-circuit conditions, the temperature dependence of the Miller's index n and its role in the disappearance of the negative-differential resistance in the input characteristics of the transistor have been studied experimentally and explained theoretically. It is concluded that the nature of the reverse volt-ampere characteristics of a p-n junction depends upon the impurity concentrations on the two sides of the depletion layer. When the impurity concentrations are low, there is a negative differential resistance in the output characteristics of the transistor operating in the avalanche mode.

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