A Unique Method for Measuring Dielectric Constant of Low Loss Materials at Microwave and Millimeter Wave Frequencies

Abstract

The dielectric constant value are the most important parameters in the materials science technology. In microwave and millimeter dielectric circuits the value of this parameter should be known accurately. In this paper a novel approach to the measurement of the dielectric constant of low loss materials at microwave and millimeter wave frequencies has been discussed. This method is verified experimentally also.

Indexing terms:

• Microwave
• Millimeter wave
• Dielectric constant