An ATE for LSI/VLSI Device Handling and Tests

Abstract

Automatic Test Equipments (A T E) are versatile and flexible systems which can be easily adaptable to any application. The paper describes an A T E developed at CSIO, Chandigarh for the production testing of LSI/VLSI devices. It has the capability of device handling as well, which automatically loads and separates out good and bad devices into bins after the test is over

Indexing terms:

• Automatic test equipments
• LSI/VLSI devices