Abstract
Characterization of the various integrated optic (IO) components assumes greater significance as more efforts are put into the realization of IO devices. Since waveguides are essential components in any IO device, several techniques have been developed over the years for waveguide characterization. Prism coupling is one such extensively used technique. The present paper describes a software program developed for execution on an IBM compatible personal computer (PC) to reconstruct the refractive index profile of an ion-exchanged waveguide from the results of the prism coupling experiment.
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