Non-Contact Microprocessor Based Digital Laser Scanning Micrometer

Abstract

In the present paper technical design details of a non-contact digital laser scanning micrometer based on microprocessor have been given. The system uses a low power He-Ne laser and works well in a hostile environment. The instrument can measure outer diameter, internal diameter, thickness and other multidimensions of different type of objects. Besides, it works well for in sito measurement. An accuracy of better than ten micron has been achieved in the range of 1–35 mm.

Indexing terms:

• Non-contact micrometer
• Laser based dimension measurement
• Diameter measurement
• Micrometer