Skewed-port Device Measurements using Vector Accuracy Enchancement Techniques

Abstract

Many methods have been discussed for the accuracy enchancement of microwave measurements in the literature using mainly standards like short, open, matched load and thru for the error characterisation. In case of skewed-port device measurements the thru becomes a bend which is non-standard. A method is presented here to characterise non-standard bend as standard and finding system errors using characterised bend as standard for the skewed-port device measurements.