Resonating Techniques for the Measurement of Microwave Surface Impedance

Abstract

Since the discovery of HTS materials, various techniques have been used for microwave characterization spanning the frequency range from few MHz to >100 GHz and temperature ranging from few Kelvin to room temperature. In this paper, we shall discuss the established techniques based on resonating structures as well as the merits and demerits of these techniques.

Indexing terms:

• Microwave characterization
• Surface resistance
• High temperature superconductor

Additional information

Notes on contributors

N D Kataria

N D Kataria was born in Taunggyi, Myanmar in 1948. He received the BSc (Hons), MSc and PhD in Physics from the University of Delhi, India in 1970, 1972 and 1977 respectively. Since 1977 he has been working as a scientist at National Physical Laboratory, New Delhi, India.

In 1980–82 he visited Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany under Deutscher Academischer Austauschdienst (DAAD) fellowship and worked on LTS Josephson junctions and SQUIDs. He again worked at PTB, Braunschweig from 1989–91, as contract scientist under Volkswagen-Stiftung, on growth and device fabrication of high temperature superconductor (HTS) thin film. Since 1992, he has been working on HTS thin film processing, microwave measurement and device application of HTS thin films. His current research interest is in the area HTS passive devices and high-Q dielectric resonator for frequency stable oscillator.

He is author of many scientific papers and contributed chapters in two books on microwave characterization of HTS. He is a member of Indian Cryogenic Council and recipient of 1990 AN Chatterjee Memorial award.

Mukul Misra

Mukul Misra was born at Lucknow, India, in 1969. He received BSc and MSc degrees in Physics from the Lucknow University, India, respectively in 1990 and 1993. He got the award of research fellowship from Council of Scientific and Industrial Research, India, in 1994 and joined the National Physical Laboratory, New Delhi, India, in early 1995 to work for his PhD degree.

Since 1995 he has been investigating the various aspects affecting the accuracy of microwave surface impedance measurement of high-temperature superconductors by resonant techniques. He has submitted his thesis to the University of Delhi, India, in May 1999. His current interest includes microwave characterization of high-temperature superconducting thin films and their application for microwave passive devices.