Experimental Verification of a New Oscillation-based Test Algorithm for Analog Circuits

M. ParaiSchool of VLSI Technology, Indian Institute of Engineering Science & Technology, Shibpur, Botanic Garden, Howrah, West Bengal711 103, IndiaView further author information

S. SrimaniSchool of VLSI Technology, Indian Institute of Engineering Science & Technology, Shibpur, Botanic Garden, Howrah, West Bengal711 103, IndiaView further author information

K. GhoshSchool of VLSI Technology, Indian Institute of Engineering Science & Technology, Shibpur, Botanic Garden, Howrah, West Bengal711 103, IndiaCorrespondence[email protected]
View further author information

H. RahamanSchool of VLSI Technology, Indian Institute of Engineering Science & Technology, Shibpur, Botanic Garden, Howrah, West Bengal711 103, IndiaView further author information

Abstract

Oscillation-based test algorithm has been proposed and verified experimentally as an alternative to the specification--based test of analog circuits. Active filters are transformed to oscillators using nonlinear feedback, realized with a Schmitt trigger. Faults are detected based on the deviation of the oscillation frequency outside the tolerance band due to the variation of different circuit components under test. This proposed technique ensures high test precision due to the processing of the oscillation frequency with the help of a purely digital circuit. Undetectable ranges of parametric faults of circuit components have been identified by simulation with Cadence virtuoso using the 0.18 µm CMOS technology. Then, practical circuits of second order Butterworth Low Pass Filter and Sallen-Key Band Pass Filter have been tested experimentally. Experimental results ensure high fault coverage of the proposed test strategy.

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Funding

This work is supported by Special Manpower Development Program for Chips to System Design (SMDP-C2SD) of Ministry of Electronics & Information Technology, Government of India.

Notes on contributors

M. Parai

M Parai is currently pursuing PhD from IIEST, Shibpur. His research interests include testing of AMS circuits and embedded system design. Email: [email protected]

S. Srimani

S Srimani is currently pursuing PhD from IIEST, Shibpur. His research interests are in the fields of VLSI and mixed-signal testing, fault-tolerant computing. Email: [email protected]

K. Ghosh

K Ghosh (S’16) is currently working as a project faculty at IIEST, Shibpur. Her research interests include the design and testing of analog VLSI circuits.

H. Rahaman

H Rahaman (SM’10) currently is a faculty member of the Indian Institute of Engineering Science and Technology (IIEST), Shibpur, India. His research interests include the design and testing of integrated circuits, nano-biochips and emerging nanotechnologies, including reversible quantum computing. He has published more than 300 research articles in archival journals and refereed conference proceedings. Email: [email protected]

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