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Abstract
An extraction replica method is described by means of which thin solid film on worn surfaces may be removed from selected areas for examination in the transmission electron microscope. A scratch or several scratches are made on the worn surface with a pointed stylus. Displaced or loosened fragments of material are removed by means of a plastic extraction replica. After subsequent processing of the replica, sufficiently thin fragments can then be examined by transmission electron microscopy, electron diffraction, and the allied methods of x-ray energy dispersive analysis and electron energy loss spectroscopy. The latter two methods permit the determination of chemical composition which can then be correlated with crystallographic and microstructural observations. Application of the scratch extraction replica method is illustrated with examples of films removed from worn 52100 steel surfaces.
Presented at the 39th Annual Meeting in Chicago, Illinois, May 7–10, 1984
Notes
Presented at the 39th Annual Meeting in Chicago, Illinois, May 7–10, 1984