Microstrain and Defect Analysis of CL-20 Crystals by Novel X-Ray Methods

ABSTRACT

Microstrains and defects are introduced during synthesis and crystal-growth stages of energetic particles and increase during processing stages such as grinding, mixing, and extrusion. The detection and quantification of these microstrains and defects in a given particle population is a difficult task that requires highly sensitive techniques. In this study a novel X-ray diffraction technique (XAPS) based on simultaneous rocking-curve analysis of individual particles was successfully applied to CL-20 powders. The effects of synthesis, grinding, and static loads on the extent of microstrain and defect development in CL-20 particles were quantitatively determined as frequency versus half-width of rocking curves. The greater half-width values observed for the samples subjected to grinding and static loads indicated greater microstrain and defect density in comparison to the as-received samples of CL-20. It may be possible to relate the findings of such analysis to combustion calculations for energetic particles in general and to CL-20 particles in particular.

Keywords:

• CL-20
• X-ray diffraction