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Sequential Analysis
Design Methods and Applications
Volume 18, 1999 - Issue 2
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Original Articles

Approximations for non-symmetric truncated sequential and repeated significance tests

Approximations for non-symmetric truncated sequential and repeated significance tests

Pages 107-117 | Published online: 29 Mar 2007
 

Abstract

Let X1, X2…XN be a random sample from a N(μ, l) population. Using the B-value process {B(t); 0 ≤ t ≤ 1} introduced by Lan and Wittes (1988) one ran design a sequential test for H0 : μ = μ0 versus H1 : μ > μ0 for some functions γ1(t) > γ2(t): if B(t) > γ1(t) stop and reject H0 , if B(t) < γ2(t) stop and do not reject H0 , otherwise take one more observation. When t = 1, stop anyway rejecting H0 if B(1) > γ1(1). We suggest some approximations which are usually upper bounds for the significance level, power of the tests and lower bounds for the expected stopping time. Simulations show that the approximations get better as N → ∞ and/or μ → ∞. The exact values are difficult to obtain while the suggested approximations are very easy to compute in the case of linear and RST type boundaries and simulation results show that they are quite reasonable in several cases, even for moderate N.

Address: [email protected] and [email protected]. Departmento de Estatistica, IMECC

Address: [email protected] and [email protected]. Departmento de Estatistica, IMECC

Notes

Address: [email protected] and [email protected]. Departmento de Estatistica, IMECC

Additional information

Notes on contributors

Ronaldo Dias

Nancy Lopes Garcia

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