Publication Cover
High Pressure Research
An International Journal
Volume 19, 2000 - Issue 1-6
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Original Articles

Single crystal EXAFS at high pressure

, , , , &
Pages 335-340 | Received 09 Sep 1999, Published online: 19 Aug 2006
 

Abstract

We present a new technique for structure characterization under high pressure conditions. The use of an undulator beam of the third-generation ESRF source of synchrotron radiation has enabled the first single crystal EXAFS experiments at high pressure using a diamond anvil cell as pressure generator. Taking advantage of the linear polarization of X-rays the technique becomes an orientation-selective probe of the local structure of materials. We describe the principle of the technique and some applications.

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