Discussion of “Scaling-up process characterization”

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About the authors

William H. Woodall is a Professor of Statistics at Virginia Tech. He is a former editor of the Journal of Quality Technology (2001–2003) and associate editor of Technometrics (1987–1995). He has published over 140 papers, most on various aspects of process monitoring. He is the recipient of the ASQ Shewhart Medal (2002), ENBIS Box Medal (2012), Jack Youden Prize (1995, 2003), ASQ Brumbaugh Award (2000, 2006), Ellis Ott Foundation Award (1987), Soren Bisgaard Award (2012), Lloyd S. Nelson Award (2014), and a best paper award for IIE Transactions on Quality and Reliability Engineering (1997). He is a Fellow of the American Statistical Association, a Fellow of the American Society for Quality, and an elected member of the International Statistical Institute.

Lata Kodali is a third-year Ph.D. student in Department of Statistics at Virginia Tech.

Emmanuel Yashchin is a member of the Data Analytics Department at the IBM Thomas J. Watson Research Center. He joined IBM in 1983. He received a Diploma in Applied Mathematics from Vilnius State University in 1974, a M.Sc. in Operations Research and the D.Sc. in Statistics from the Technion – Israel Institute of Technology in 1977 and 1981, respectively. In 1982 he was a Visiting Assistant Professor at the Iowa State University. From 1996–2002 he served as the Manager of Statistics Group in IBM Research. His research interests include change point models, quality control, statistical process control, reliability, spatial statistics, risk analysis, extreme value theory, and operations research. He is a co-editor of Applied Stochastic Models in Business and Industry, Elected Member of the International Statistical Institute, Fellow of the American Statistical Association, and Senior Member of the American Society for Quality.

Funding

The work of W. H. Woodall was supported by NSF Grant CMMI-1436365.