Abstract
This paper presents the construction and validation of a novel bistatic measurement system for the purpose of accurately measuring the scattering from a centralised target. Unlike previous systems, this bistatic system is capable of a measurement. Empty chamber calibrations are completed to ensure that any unexpected noise in scattering patterns is understood. Measurements of a flat, perfect electrically conducting plate and more complex frequency-selective surfaces are presented and highlight the effectiveness of the system. Finally, time gating is integrated into the measurement system to allow for noise reduced characterisation. Three-dimensional scattering images are plotted using the measured data, with good agreement to simulated results reported on in previous publications.