![Sample our Physical Sciences journals, sign in here to start your FREE access for 14 days]({"type":"image" , "src" : "/sda/110819/TOC-Subject-Sample-2021-Physical-Sciences.jpg"})
Abstract
The nondestructive characterization of in situ conductor-backed media is an important task for many commercial and military applications. These and similar applications may require completely nondestructive and noncontact free space material characterization methods. Free space methods which fit these characteristics are at premium. One such of these methods is the dual polarization method. The dual polarization method utilizes the measurement of the reflection coefficient at both parallel and perpendicular polarization to determine the permittivity and permeability of an unknown material sample. This paper presents an overview of the dual polarization method to characterize conductor-backed media and two additional implementations of the method specific only to dielectric materials. These additional implementations include the characterization of conductor-backed dielectrics with either known or unknown sample thickness. All three implementations of the dual polarization method presented are demonstrated with measured reflection data from a conductor-backed Plexiglas sample and are shown with accompanying sensitivity analysis.
Notes
No potential conflict of interest was reported by the authors.