Abstract
In this study, a low-profile ultra-thin metasurface-based reflection-type polarization converter with enhanced bandwidth for X-band (8.2–12.4 GHz) applications is proposed. The designed converter, which has a cell topology above a substrate (FR-4) material terminated in a metal conductor with overall thickness of 1.2 mm corresponding to a thickness of in terms of wavelength (ultra-thin), indicates the cross polarization performance with a polarization converter ratio (PCR) value of 90% in a wide (9–12 GHz) frequency range (normal incidence) and linear to circular polarization performance with left-handed circular polarization between 8.44 and 8.58 GHz and between 12.74 and 13.14 GHz. It is observed that the converter has a PCR value of 80% for incidence angles up to . Simulations of the designed converter performed by a commercial electromagnetic simulation program (CST Microwave Studio) were validated by free-space measurements.
Disclosure statement
No potential conflict of interest was reported by the author(s).
Additional information
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Gokhan Ozturk
Gokhan Ozturk received the B.Sc. degree in electrical and electronics engineering from Fırat University, Elazıg, Turkey, in 2009, and the M.Sc. and Ph.D. degrees in electrical and electronics engineering from Ataturk University, Erzurum, Turkey, in 2014 and 2018, respectively.
Since 2019, he has been an Assistant Professor with the Department of Electrical and Electronics Engineering, Ataturk University. His current research interests include the characterization of material by microwaves, metamaterials, and numerical methods in electromagnetics.